Combining Instance-Based Learning and Logistic Regression for Multilabel Classification

Cheng and Hüllermeier. "Combining Instance-Based Learning and Logistic Regression for Multilabel Classification." European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2009. doi:10.1007/978-3-642-04180-8_6

[Cheng and Hüllermeier. "Combining Instance-Based Learning and Logistic Regression for Multilabel Classification." European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2009.](https://mlanthology.org/ecmlpkdd/2009/cheng2009ecmlpkdd-combining/) doi:10.1007/978-3-642-04180-8_6

@inproceedings{cheng2009ecmlpkdd-combining,
  title     = {{Combining Instance-Based Learning and Logistic Regression for Multilabel Classification}},
  author    = {Cheng, Weiwei and Hüllermeier, Eyke},
  booktitle = {European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases},
  year      = {2009},
  pages     = {6},
  doi       = {10.1007/978-3-642-04180-8_6},
  url       = {https://mlanthology.org/ecmlpkdd/2009/cheng2009ecmlpkdd-combining/}
}