Dembczynski et al. "Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss." European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2010. doi:10.1007/978-3-642-15880-3_24
Markdown
[Dembczynski et al. "Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss." European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2010.](https://mlanthology.org/ecmlpkdd/2010/dembczynski2010ecmlpkdd-regret/) doi:10.1007/978-3-642-15880-3_24
BibTeX
@inproceedings{dembczynski2010ecmlpkdd-regret,
title = {{Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss}},
author = {Dembczynski, Krzysztof and Waegeman, Willem and Cheng, Weiwei and Hüllermeier, Eyke},
booktitle = {European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases},
year = {2010},
pages = {280-295},
doi = {10.1007/978-3-642-15880-3_24},
url = {https://mlanthology.org/ecmlpkdd/2010/dembczynski2010ecmlpkdd-regret/}
}