Cid-Sueiro et al. "Consistency of Losses for Learning from Weak Labels." European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2014. doi:10.1007/978-3-662-44848-9_13
Markdown
[Cid-Sueiro et al. "Consistency of Losses for Learning from Weak Labels." European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2014.](https://mlanthology.org/ecmlpkdd/2014/cidsueiro2014ecmlpkdd-consistency/) doi:10.1007/978-3-662-44848-9_13
BibTeX
@inproceedings{cidsueiro2014ecmlpkdd-consistency,
title = {{Consistency of Losses for Learning from Weak Labels}},
author = {Cid-Sueiro, Jesús and García-García, Dario and Santos-Rodríguez, Raúl},
booktitle = {European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases},
year = {2014},
pages = {197-210},
doi = {10.1007/978-3-662-44848-9_13},
url = {https://mlanthology.org/ecmlpkdd/2014/cidsueiro2014ecmlpkdd-consistency/}
}