Wang et al. "Deep Metric Learning with Data Summarization." European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2016. doi:10.1007/978-3-319-46128-1_49
Markdown
[Wang et al. "Deep Metric Learning with Data Summarization." European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2016.](https://mlanthology.org/ecmlpkdd/2016/wang2016ecmlpkdd-deep/) doi:10.1007/978-3-319-46128-1_49
BibTeX
@inproceedings{wang2016ecmlpkdd-deep,
title = {{Deep Metric Learning with Data Summarization}},
author = {Wang, Wenlin and Chen, Changyou and Chen, Wenlin and Rai, Piyush and Carin, Lawrence},
booktitle = {European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases},
year = {2016},
pages = {777-794},
doi = {10.1007/978-3-319-46128-1_49},
url = {https://mlanthology.org/ecmlpkdd/2016/wang2016ecmlpkdd-deep/}
}