Duivesteijn et al. "Have It Both Ways - From A/B Testing to A&B Testing with Exceptional Model Mining." European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2017. doi:10.1007/978-3-319-71273-4_10
Markdown
[Duivesteijn et al. "Have It Both Ways - From A/B Testing to A&B Testing with Exceptional Model Mining." European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2017.](https://mlanthology.org/ecmlpkdd/2017/duivesteijn2017ecmlpkdd-both/) doi:10.1007/978-3-319-71273-4_10
BibTeX
@inproceedings{duivesteijn2017ecmlpkdd-both,
title = {{Have It Both Ways - From A/B Testing to A&B Testing with Exceptional Model Mining}},
author = {Duivesteijn, Wouter and Farzami, Tara and Putman, Thijs and Peer, Evertjan and Weerts, Hilde J. P. and Adegeest, Jasper N. and Foks, Gerson and Pechenizkiy, Mykola},
booktitle = {European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases},
year = {2017},
pages = {114-126},
doi = {10.1007/978-3-319-71273-4_10},
url = {https://mlanthology.org/ecmlpkdd/2017/duivesteijn2017ecmlpkdd-both/}
}