Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE

Heiter et al. "Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE." European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2024. doi:10.1007/978-3-031-70371-3_24

[Heiter et al. "Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE." European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2024.](https://mlanthology.org/ecmlpkdd/2024/heiter2024ecmlpkdd-pattern/) doi:10.1007/978-3-031-70371-3_24

@inproceedings{heiter2024ecmlpkdd-pattern,
  title     = {{Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE}},
  author    = {Heiter, Edith and Martens, Liesbet and Seurinck, Ruth and Guilliams, Martin and De Bie, Tijl and Saeys, Yvan and Lijffijt, Jefrey},
  booktitle = {European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases},
  year      = {2024},
  pages     = {379-382},
  doi       = {10.1007/978-3-031-70371-3_24},
  url       = {https://mlanthology.org/ecmlpkdd/2024/heiter2024ecmlpkdd-pattern/}
}