BatMan-CLR: Making Few-Shots Meta-Learners Resilient Against Label Noise

Galjaard et al. "BatMan-CLR: Making Few-Shots Meta-Learners Resilient Against Label Noise." European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2025. doi:10.1007/978-3-032-06106-5_15

[Galjaard et al. "BatMan-CLR: Making Few-Shots Meta-Learners Resilient Against Label Noise." European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, 2025.](https://mlanthology.org/ecmlpkdd/2025/galjaard2025ecmlpkdd-batmanclr/) doi:10.1007/978-3-032-06106-5_15

@inproceedings{galjaard2025ecmlpkdd-batmanclr,
  title     = {{BatMan-CLR: Making Few-Shots Meta-Learners Resilient Against Label Noise}},
  author    = {Galjaard, Jeroen M. and Birke, Robert and Pérez, Juan F. and Chen, Lydia Y.},
  booktitle = {European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases},
  year      = {2025},
  pages     = {254-271},
  doi       = {10.1007/978-3-032-06106-5_15},
  url       = {https://mlanthology.org/ecmlpkdd/2025/galjaard2025ecmlpkdd-batmanclr/}
}