Meta-Baseline: Exploring Simple Meta-Learning for Few-Shot Learning
Abstract
Meta-learning has been the most common framework for few-shot learning in recent years. It learns the model from collections of few-shot classification tasks, which is believed to have a key advantage of making the training objective consistent with the testing objective. However, some recent works report that by training for whole-classification, i.e. classification on the whole label-set, it can get comparable or even better embedding than many meta-learning algorithms. The edge between these two lines of works has yet been underexplored, and the effectiveness of meta-learning in few-shot learning remains unclear. In this paper, we explore a simple process: meta-learning over a whole-classification pre-trained model on its evaluation metric. We observe this simple method achieves competitive performance to state-of-the-art methods on standard benchmarks. Our further analysis shed some light on understanding the trade-offs between the meta-learning objective and the whole-classification objective in few-shot learning.
Cite
Text
Chen et al. "Meta-Baseline: Exploring Simple Meta-Learning for Few-Shot Learning." International Conference on Computer Vision, 2021. doi:10.1109/ICCV48922.2021.00893Markdown
[Chen et al. "Meta-Baseline: Exploring Simple Meta-Learning for Few-Shot Learning." International Conference on Computer Vision, 2021.](https://mlanthology.org/iccv/2021/chen2021iccv-metabaseline/) doi:10.1109/ICCV48922.2021.00893BibTeX
@inproceedings{chen2021iccv-metabaseline,
title = {{Meta-Baseline: Exploring Simple Meta-Learning for Few-Shot Learning}},
author = {Chen, Yinbo and Liu, Zhuang and Xu, Huijuan and Darrell, Trevor and Wang, Xiaolong},
booktitle = {International Conference on Computer Vision},
year = {2021},
pages = {9062-9071},
doi = {10.1109/ICCV48922.2021.00893},
url = {https://mlanthology.org/iccv/2021/chen2021iccv-metabaseline/}
}