ML Anthology

Detecting Reflectional Symmetries in 3D Data Through Symmetrical Fitting

Aleksandrs Ecins, Cornelia Fermüller, Yiannis Aloimonos
ICCVW 2017 pp. 1779-1783
doi:10.1109/ICCVW.2017.210 /iccvw/2017/ecins2017iccvw-detecting/
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Cite

Text

Ecins et al. "Detecting Reflectional Symmetries in 3D Data Through Symmetrical Fitting." IEEE/CVF International Conference on Computer Vision Workshops, 2017. doi:10.1109/ICCVW.2017.210

Markdown

[Ecins et al. "Detecting Reflectional Symmetries in 3D Data Through Symmetrical Fitting." IEEE/CVF International Conference on Computer Vision Workshops, 2017.](https://mlanthology.org/iccvw/2017/ecins2017iccvw-detecting/) doi:10.1109/ICCVW.2017.210

BibTeX

@inproceedings{ecins2017iccvw-detecting,
  title     = {{Detecting Reflectional Symmetries in 3D Data Through Symmetrical Fitting}},
  author    = {Ecins, Aleksandrs and Fermüller, Cornelia and Aloimonos, Yiannis},
  booktitle = {IEEE/CVF International Conference on Computer Vision Workshops},
  year      = {2017},
  pages     = {1779-1783},
  doi       = {10.1109/ICCVW.2017.210},
  url       = {https://mlanthology.org/iccvw/2017/ecins2017iccvw-detecting/}
}