ML Anthology

Efficient BRDF Sampling Using Projected Deviation Vector Parameterization

Tanaboon Tongbuasirilai, Jonas Unger, Murat Kurt
ICCVW 2017 pp. 153-158
doi:10.1109/ICCVW.2017.26 /iccvw/2017/tongbuasirilai2017iccvw-efficient/
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Cite

Text

Tongbuasirilai et al. "Efficient BRDF Sampling Using Projected Deviation Vector Parameterization." IEEE/CVF International Conference on Computer Vision Workshops, 2017. doi:10.1109/ICCVW.2017.26

Markdown

[Tongbuasirilai et al. "Efficient BRDF Sampling Using Projected Deviation Vector Parameterization." IEEE/CVF International Conference on Computer Vision Workshops, 2017.](https://mlanthology.org/iccvw/2017/tongbuasirilai2017iccvw-efficient/) doi:10.1109/ICCVW.2017.26

BibTeX

@inproceedings{tongbuasirilai2017iccvw-efficient,
  title     = {{Efficient BRDF Sampling Using Projected Deviation Vector Parameterization}},
  author    = {Tongbuasirilai, Tanaboon and Unger, Jonas and Kurt, Murat},
  booktitle = {IEEE/CVF International Conference on Computer Vision Workshops},
  year      = {2017},
  pages     = {153-158},
  doi       = {10.1109/ICCVW.2017.26},
  url       = {https://mlanthology.org/iccvw/2017/tongbuasirilai2017iccvw-efficient/}
}