Convolutional Experts Constrained Local Model for 3D Facial Landmark Detection

Abstract

Constrained Local Models (CLMs) are a well-established family of methods for facial landmark detection. CE-CLM, the newest member of CLMs, brings CLMs back to state of the art performance. This is done through CE-CLMs ability to model the very complex individual landmark appearance that is affected by expression, illumination, facial hair, makeup, and accessories. A crucial component of CE-CLM is a novel local detector - Convolutional Experts Network (CEN) - that brings together the advantages of neural architectures and mixtures of experts in an end-to-end framework. In this paper we use CE-CLM to learn position of dense 84 landmark positions. To achieve best performance on the Menpo3D dense landmark detection challenge, we use two complementary networks alongside CE-CLM: a network that maps the output of CE-CLM to 84 landmarks called Adjustment Network, and a Deep Residual Network called Correction Networks that learns dataset specific corrections for CE-CLM.

Cite

Text

Zadeh et al. "Convolutional Experts Constrained Local Model for 3D Facial Landmark Detection." IEEE/CVF International Conference on Computer Vision Workshops, 2017. doi:10.1109/ICCVW.2017.296

Markdown

[Zadeh et al. "Convolutional Experts Constrained Local Model for 3D Facial Landmark Detection." IEEE/CVF International Conference on Computer Vision Workshops, 2017.](https://mlanthology.org/iccvw/2017/zadeh2017iccvw-convolutional/) doi:10.1109/ICCVW.2017.296

BibTeX

@inproceedings{zadeh2017iccvw-convolutional,
  title     = {{Convolutional Experts Constrained Local Model for 3D Facial Landmark Detection}},
  author    = {Zadeh, Amir and Lim, Yao Chong and Baltrusaitis, Tadas and Morency, Louis-Philippe},
  booktitle = {IEEE/CVF International Conference on Computer Vision Workshops},
  year      = {2017},
  pages     = {2519-2528},
  doi       = {10.1109/ICCVW.2017.296},
  url       = {https://mlanthology.org/iccvw/2017/zadeh2017iccvw-convolutional/}
}