DeepVAT: A Self-Supervised Technique for Cluster Assessment in Image Datasets

Abstract

Estimating the number of clusters and cluster structures in unlabeled, complex, and high-dimensional datasets (like images) is challenging for traditional clustering algorithms. In recent years, a matrix reordering-based algorithm called Visual Assessment of Tendency (VAT), and its variants have attracted many researchers from various domains to estimate the number of clusters and inherent cluster structure present in the data. However, these algorithms face significant challenges when dealing with image data as they fail to effectively capture the crucial features inherent in images. To overcome these limitations, we propose a deep-learning-based framework that enables the assessment of cluster structure in complex image datasets. Our approach utilizes a self-supervised deep neural network to generate representative embeddings for the data. These embeddings are then reduced to 2-dimension using t-distributed Stochastic Neighbour Embedding (t-SNE) and inputted into VAT based algorithms to estimate the underlying cluster structure. Importantly, our framework does not rely on any prior knowledge of the number of clusters. Our proposed approach demonstrates superior performance compared to state-of-the-art VAT family algorithms and two other deep clustering algorithms on four benchmark image datasets, namely MNIST, FMNIST, CIFAR-10, and INTEL.

Cite

Text

Mazumder et al. "DeepVAT: A Self-Supervised Technique for Cluster Assessment in Image Datasets." IEEE/CVF International Conference on Computer Vision Workshops, 2023. doi:10.1109/ICCVW60793.2023.00026

Markdown

[Mazumder et al. "DeepVAT: A Self-Supervised Technique for Cluster Assessment in Image Datasets." IEEE/CVF International Conference on Computer Vision Workshops, 2023.](https://mlanthology.org/iccvw/2023/mazumder2023iccvw-deepvat/) doi:10.1109/ICCVW60793.2023.00026

BibTeX

@inproceedings{mazumder2023iccvw-deepvat,
  title     = {{DeepVAT: A Self-Supervised Technique for Cluster Assessment in Image Datasets}},
  author    = {Mazumder, Alokendu and Baruah, Tirthajit and Singh, Akash Kumar and Murthy, Pagadala Krishna and Pattanaik, Vishwajeet and Rathore, Punit},
  booktitle = {IEEE/CVF International Conference on Computer Vision Workshops},
  year      = {2023},
  pages     = {187-195},
  doi       = {10.1109/ICCVW60793.2023.00026},
  url       = {https://mlanthology.org/iccvw/2023/mazumder2023iccvw-deepvat/}
}