Improved Sample Complexities for Deep Neural Networks and Robust Classification via an All-Layer Margin

Wei and Ma. "Improved Sample Complexities for Deep Neural Networks and Robust Classification via an All-Layer Margin." International Conference on Learning Representations, 2020.

[Wei and Ma. "Improved Sample Complexities for Deep Neural Networks and Robust Classification via an All-Layer Margin." International Conference on Learning Representations, 2020.](https://mlanthology.org/iclr/2020/wei2020iclr-improved/)

@inproceedings{wei2020iclr-improved,
  title     = {{Improved Sample Complexities for Deep Neural Networks and Robust Classification via an All-Layer Margin}},
  author    = {Wei, Colin and Ma, Tengyu},
  booktitle = {International Conference on Learning Representations},
  year      = {2020},
  url       = {https://mlanthology.org/iclr/2020/wei2020iclr-improved/}
}