ML Anthology

Finding an Optimal Gain-Ratio Subset-Split Test for a Set-Valued Attribute in Decision Tree Induction

Fumio Takechi, Einoshin Suzuki
ICML 2002 pp. 618-625
/icml/2002/takechi2002icml-finding/
Semantic Scholar

Cite

Text

Takechi and Suzuki. "Finding an Optimal Gain-Ratio Subset-Split Test for a Set-Valued Attribute in Decision Tree Induction." International Conference on Machine Learning, 2002.

Markdown

[Takechi and Suzuki. "Finding an Optimal Gain-Ratio Subset-Split Test for a Set-Valued Attribute in Decision Tree Induction." International Conference on Machine Learning, 2002.](https://mlanthology.org/icml/2002/takechi2002icml-finding/)

BibTeX

@inproceedings{takechi2002icml-finding,
  title     = {{Finding an Optimal Gain-Ratio Subset-Split Test for a Set-Valued Attribute in Decision Tree Induction}},
  author    = {Takechi, Fumio and Suzuki, Einoshin},
  booktitle = {International Conference on Machine Learning},
  year      = {2002},
  pages     = {618-625},
  url       = {https://mlanthology.org/icml/2002/takechi2002icml-finding/}
}