Feature Value Acquisition in Testing: A Sequential Batch Test Algorithm

Cite

Text

Sheng and Ling. "Feature Value Acquisition in Testing: A Sequential Batch Test Algorithm." International Conference on Machine Learning, 2006. doi:10.1145/1143844.1143946

Markdown

[Sheng and Ling. "Feature Value Acquisition in Testing: A Sequential Batch Test Algorithm." International Conference on Machine Learning, 2006.](https://mlanthology.org/icml/2006/sheng2006icml-feature/) doi:10.1145/1143844.1143946

BibTeX

@inproceedings{sheng2006icml-feature,
  title     = {{Feature Value Acquisition in Testing: A Sequential Batch Test Algorithm}},
  author    = {Sheng, Victor S. and Ling, Charles X.},
  booktitle = {International Conference on Machine Learning},
  year      = {2006},
  pages     = {809-816},
  doi       = {10.1145/1143844.1143946},
  url       = {https://mlanthology.org/icml/2006/sheng2006icml-feature/}
}