Label Ranking Methods Based on the Plackett-Luce Model

Abstract

This paper introduces two new methods for label ranking based on a probabilistic model of ranking data, called the Plackett-Luce model. The idea of the first method is to use the PL model to fit locally constant probability models in the context of instance-based learning. As opposed to this, the second method estimates a global model in which the PL parameters are represented as functions of the instance. Comparing our methods with previous approaches to label ranking, we find that they offer a number of advantages. Experimentally, we moreover show that they are highly competitive to start-of-the-art methods in terms of predictive accuracy, especially in the case of training data with incomplete ranking information.

Cite

Text

Cheng et al. "Label Ranking Methods Based on the Plackett-Luce Model." International Conference on Machine Learning, 2010.

Markdown

[Cheng et al. "Label Ranking Methods Based on the Plackett-Luce Model." International Conference on Machine Learning, 2010.](https://mlanthology.org/icml/2010/cheng2010icml-label/)

BibTeX

@inproceedings{cheng2010icml-label,
  title     = {{Label Ranking Methods Based on the Plackett-Luce Model}},
  author    = {Cheng, Weiwei and Dembczynski, Krzysztof and Hüllermeier, Eyke},
  booktitle = {International Conference on Machine Learning},
  year      = {2010},
  pages     = {215-222},
  url       = {https://mlanthology.org/icml/2010/cheng2010icml-label/}
}