Randomized Gaussian Process Upper Confidence Bound with Tighter Bayesian Regret Bounds

Abstract

Gaussian process upper confidence bound (GP-UCB) is a theoretically promising approach for black-box optimization; however, the confidence parameter $\beta$ is considerably large in the theorem and chosen heuristically in practice. Then, randomized GP-UCB (RGP-UCB) uses a randomized confidence parameter, which follows the Gamma distribution, to mitigate the impact of manually specifying $\beta$. This study first generalizes the regret analysis of RGP-UCB to a wider class of distributions, including the Gamma distribution. Furthermore, we propose improved RGP-UCB (IRGP-UCB) based on a two-parameter exponential distribution, which achieves tighter Bayesian regret bounds. IRGP-UCB does not require an increase in the confidence parameter in terms of the number of iterations, which avoids over-exploration in the later iterations. Finally, we demonstrate the effectiveness of IRGP-UCB through extensive experiments.

Cite

Text

Takeno et al. "Randomized Gaussian Process Upper Confidence Bound with Tighter Bayesian Regret Bounds." International Conference on Machine Learning, 2023.

Markdown

[Takeno et al. "Randomized Gaussian Process Upper Confidence Bound with Tighter Bayesian Regret Bounds." International Conference on Machine Learning, 2023.](https://mlanthology.org/icml/2023/takeno2023icml-randomized/)

BibTeX

@inproceedings{takeno2023icml-randomized,
  title     = {{Randomized Gaussian Process Upper Confidence Bound with Tighter Bayesian Regret Bounds}},
  author    = {Takeno, Shion and Inatsu, Yu and Karasuyama, Masayuki},
  booktitle = {International Conference on Machine Learning},
  year      = {2023},
  pages     = {33490-33515},
  volume    = {202},
  url       = {https://mlanthology.org/icml/2023/takeno2023icml-randomized/}
}