Test-Time Adaptation with Binary Feedback
Abstract
Deep learning models perform poorly when domain shifts exist between training and test data. Test-time adaptation (TTA) is a paradigm to mitigate this issue by adapting pre-trained models using only unlabeled test samples. However, existing TTA methods can fail under severe domain shifts, while recent active TTA approaches requiring full-class labels are impractical due to high labeling costs. To address this issue, we introduce a new setting of TTA with binary feedback, which uses a few binary feedbacks from annotators to indicate whether model predictions are correct, thereby significantly reducing the labeling burden of annotators. Under the setting, we propose BiTTA, a novel dual-path optimization framework that leverages reinforcement learning to balance binary feedback-guided adaptation on uncertain samples with agreement-based self-adaptation on confident predictions. Experiments show BiTTA achieves substantial accuracy improvements over state-of-the-art baselines, demonstrating its effectiveness in handling severe distribution shifts with minimal labeling effort.
Cite
Text
Lee et al. "Test-Time Adaptation with Binary Feedback." Proceedings of the 42nd International Conference on Machine Learning, 2025.Markdown
[Lee et al. "Test-Time Adaptation with Binary Feedback." Proceedings of the 42nd International Conference on Machine Learning, 2025.](https://mlanthology.org/icml/2025/lee2025icml-testtime/)BibTeX
@inproceedings{lee2025icml-testtime,
title = {{Test-Time Adaptation with Binary Feedback}},
author = {Lee, Taeckyung and Chottananurak, Sorn and Kim, Junsu and Shin, Jinwoo and Gong, Taesik and Lee, Sung-Ju},
booktitle = {Proceedings of the 42nd International Conference on Machine Learning},
year = {2025},
pages = {33005-33024},
volume = {267},
url = {https://mlanthology.org/icml/2025/lee2025icml-testtime/}
}