ML Anthology

Fault-Model-Based Test Generation for Embedded Software

Michael Esser, Peter Struss
IJCAI 2007 pp. 342-347
/ijcai/2007/esser2007ijcai-fault/
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Cite

Text

Esser and Struss. "Fault-Model-Based Test Generation for Embedded Software." International Joint Conference on Artificial Intelligence, 2007.

Markdown

[Esser and Struss. "Fault-Model-Based Test Generation for Embedded Software." International Joint Conference on Artificial Intelligence, 2007.](https://mlanthology.org/ijcai/2007/esser2007ijcai-fault/)

BibTeX

@inproceedings{esser2007ijcai-fault,
  title     = {{Fault-Model-Based Test Generation for Embedded Software}},
  author    = {Esser, Michael and Struss, Peter},
  booktitle = {International Joint Conference on Artificial Intelligence},
  year      = {2007},
  pages     = {342-347},
  url       = {https://mlanthology.org/ijcai/2007/esser2007ijcai-fault/}
}