Wei and Li. "Supervised Deep Features for Software Functional Clone Detection by Exploiting Lexical and Syntactical Information in Source Code." International Joint Conference on Artificial Intelligence, 2017. doi:10.24963/IJCAI.2017/423
Markdown
[Wei and Li. "Supervised Deep Features for Software Functional Clone Detection by Exploiting Lexical and Syntactical Information in Source Code." International Joint Conference on Artificial Intelligence, 2017.](https://mlanthology.org/ijcai/2017/wei2017ijcai-supervised/) doi:10.24963/IJCAI.2017/423
BibTeX
@inproceedings{wei2017ijcai-supervised,
title = {{Supervised Deep Features for Software Functional Clone Detection by Exploiting Lexical and Syntactical Information in Source Code}},
author = {Wei, Huihui and Li, Ming},
booktitle = {International Joint Conference on Artificial Intelligence},
year = {2017},
pages = {3034-3040},
doi = {10.24963/IJCAI.2017/423},
url = {https://mlanthology.org/ijcai/2017/wei2017ijcai-supervised/}
}