Learning What to Monitor: Using Machine Learning to Improve past STL Monitoring

Brunello et al. "Learning What to Monitor: Using Machine Learning to Improve past STL Monitoring." International Joint Conference on Artificial Intelligence, 2024.

[Brunello et al. "Learning What to Monitor: Using Machine Learning to Improve past STL Monitoring." International Joint Conference on Artificial Intelligence, 2024.](https://mlanthology.org/ijcai/2024/brunello2024ijcai-learning/)

@inproceedings{brunello2024ijcai-learning,
  title     = {{Learning What to Monitor: Using Machine Learning to Improve past STL Monitoring}},
  author    = {Brunello, Andrea and Geatti, Luca and Montanari, Angelo and Saccomanno, Nicola},
  booktitle = {International Joint Conference on Artificial Intelligence},
  year      = {2024},
  pages     = {3270-3280},
  url       = {https://mlanthology.org/ijcai/2024/brunello2024ijcai-learning/}
}