Ting et al. "DeCo: Defect-Aware Modeling with Contrasting Matching for Optimizing Task Assignment in Online IC Testing." International Joint Conference on Artificial Intelligence, 2025. doi:10.24963/IJCAI.2025/1042
Markdown
[Ting et al. "DeCo: Defect-Aware Modeling with Contrasting Matching for Optimizing Task Assignment in Online IC Testing." International Joint Conference on Artificial Intelligence, 2025.](https://mlanthology.org/ijcai/2025/ting2025ijcai-deco/) doi:10.24963/IJCAI.2025/1042
BibTeX
@inproceedings{ting2025ijcai-deco,
title = {{DeCo: Defect-Aware Modeling with Contrasting Matching for Optimizing Task Assignment in Online IC Testing}},
author = {Ting, Lo Pang-Yun and Chiang, Yu-Hao and Tsai, Yi-Tung and Lai, Hsu-Chao and Chuang, Kun-Ta},
booktitle = {International Joint Conference on Artificial Intelligence},
year = {2025},
pages = {9375-9383},
doi = {10.24963/IJCAI.2025/1042},
url = {https://mlanthology.org/ijcai/2025/ting2025ijcai-deco/}
}