Layered Critical Values: A Powerful Direct-Adjustment Approach to Discovering Significant Patterns

Webb. "Layered Critical Values: A Powerful Direct-Adjustment Approach to Discovering Significant Patterns." Machine Learning, 2008. doi:10.1007/S10994-008-5046-X

[Webb. "Layered Critical Values: A Powerful Direct-Adjustment Approach to Discovering Significant Patterns." Machine Learning, 2008.](https://mlanthology.org/mlj/2008/webb2008mlj-layered/) doi:10.1007/S10994-008-5046-X

@article{webb2008mlj-layered,
  title     = {{Layered Critical Values: A Powerful Direct-Adjustment Approach to Discovering Significant Patterns}},
  author    = {Webb, Geoffrey I.},
  journal   = {Machine Learning},
  year      = {2008},
  pages     = {307-323},
  doi       = {10.1007/S10994-008-5046-X},
  volume    = {71},
  url       = {https://mlanthology.org/mlj/2008/webb2008mlj-layered/}
}