B-Test: A Non-Parametric, Low Variance Kernel Two-Sample Test

Abstract

We propose a family of maximum mean discrepancy (MMD) kernel two-sample tests that have low sample complexity and are consistent. The test has a hyperparameter that allows one to control the tradeoff between sample complexity and computational time. Our family of tests, which we denote as B-tests, is both computationally and statistically efficient, combining favorable properties of previously proposed MMD two-sample tests. It does so by better leveraging samples to produce low variance estimates in the finite sample case, while avoiding a quadratic number of kernel evaluations and complex null-hypothesis approximation as would be required by tests relying on one sample U-statistics. The B-test uses a smaller than quadratic number of kernel evaluations and avoids completely the computational burden of complex null-hypothesis approximation while maintaining consistency and probabilistically conservative thresholds on Type I error. Finally, recent results of combining multiple kernels transfer seamlessly to our hypothesis test, allowing a further increase in discriminative power and decrease in sample complexity.

Cite

Text

Zaremba et al. "B-Test: A Non-Parametric, Low Variance Kernel Two-Sample Test." Neural Information Processing Systems, 2013.

Markdown

[Zaremba et al. "B-Test: A Non-Parametric, Low Variance Kernel Two-Sample Test." Neural Information Processing Systems, 2013.](https://mlanthology.org/neurips/2013/zaremba2013neurips-btest/)

BibTeX

@inproceedings{zaremba2013neurips-btest,
  title     = {{B-Test: A Non-Parametric, Low Variance Kernel Two-Sample Test}},
  author    = {Zaremba, Wojciech and Gretton, Arthur and Blaschko, Matthew},
  booktitle = {Neural Information Processing Systems},
  year      = {2013},
  pages     = {755-763},
  url       = {https://mlanthology.org/neurips/2013/zaremba2013neurips-btest/}
}