Two Generator Game: Learning to Sample via Linear Goodness-of-Fit Test
Abstract
Learning the probability distribution of high-dimensional data is a challenging problem. To solve this problem, we formulate a deep energy adversarial network (DEAN), which casts the energy model learned from real data into an optimization of a goodness-of-fit (GOF) test statistic. DEAN can be interpreted as a GOF game between two generative networks, where one explicit generative network learns an energy-based distribution that fits the real data, and the other implicit generative network is trained by minimizing a GOF test statistic between the energy-based distribution and the generated data, such that the underlying distribution of the generated data is close to the energy-based distribution. We design a two-level alternative optimization procedure to train the explicit and implicit generative networks, such that the hyper-parameters can also be automatically learned. Experimental results show that DEAN achieves high quality generations compared to the state-of-the-art approaches.
Cite
Text
Ding et al. "Two Generator Game: Learning to Sample via Linear Goodness-of-Fit Test." Neural Information Processing Systems, 2019.Markdown
[Ding et al. "Two Generator Game: Learning to Sample via Linear Goodness-of-Fit Test." Neural Information Processing Systems, 2019.](https://mlanthology.org/neurips/2019/ding2019neurips-two/)BibTeX
@inproceedings{ding2019neurips-two,
title = {{Two Generator Game: Learning to Sample via Linear Goodness-of-Fit Test}},
author = {Ding, Lizhong and Yu, Mengyang and Liu, Li and Zhu, Fan and Liu, Yong and Li, Yu and Shao, Ling},
booktitle = {Neural Information Processing Systems},
year = {2019},
pages = {11260-11271},
url = {https://mlanthology.org/neurips/2019/ding2019neurips-two/}
}