Multiscale Fully Convolutional Network with Application to Industrial Inspection

Bian et al. "Multiscale Fully Convolutional Network with Application to Industrial Inspection." IEEE/CVF Winter Conference on Applications of Computer Vision, 2016. doi:10.1109/WACV.2016.7477595

[Bian et al. "Multiscale Fully Convolutional Network with Application to Industrial Inspection." IEEE/CVF Winter Conference on Applications of Computer Vision, 2016.](https://mlanthology.org/wacv/2016/bian2016wacv-multiscale/) doi:10.1109/WACV.2016.7477595

@inproceedings{bian2016wacv-multiscale,
  title     = {{Multiscale Fully Convolutional Network with Application to Industrial Inspection}},
  author    = {Bian, Xiao and Lim, Ser-Nam and Zhou, Ning},
  booktitle = {IEEE/CVF Winter Conference on Applications of Computer Vision},
  year      = {2016},
  pages     = {1-8},
  doi       = {10.1109/WACV.2016.7477595},
  url       = {https://mlanthology.org/wacv/2016/bian2016wacv-multiscale/}
}